General Instrumentation Department
|Dr. Ioannis Alexopoulos|
|Radboud University, Faculty of Science|
|Dr. I. Alexopoulos, Geert-Jan Janssen|
|Confocal LSM and fluorescence microscopy, deconvolution microscopy, live imaging, image processing and automated image analysis, Bright-field / phase-contrast / DIC / polarization / dark-field microscopy.
SEM (with a cryo-unit) and TEM (also with cryo-tomography and EDS detection), various coaters, high-pressure freezing and (cryo)-ultramicrotomes
|The GI department is a supportive department serving users from the Radboud University but also from other research institutes and companies|
|Leica SP8 Inverted CLSM
· Lasers: 405nm, 488nm, 552nm and 638nm
· Detectors: 2HyD, 1GaASP PMT, 1TL-PMT.
· Objectives: 10xAir/0.4, 20xAir/0.75, 20xAir/0.4 LD, 40xOil/1.3, 40xAir/0.6 LD, 63xOil/1.4.
· Software modules: Navigator module from Leica.
· Special Features: Widefield setup with a Leica DFC7000 GT camera.
Leica SP8 Inverted CLSM
· Lasers: 405nm, pulsed White Light Laser (WLL) 470-670nm
· Detectors: 2 GaASP PMTs, 2 HyDs , 1 TL PMT
· Objectives: 10xAir/0.4, 20xAir/0.4 LD, 40xAir/0.6 LD, 40xWater/1.1 with a water-pump, 63xOil/1.4, 100xOil/1.4
· Live Imaging Setup: With temperature controller and CO2 gas mixer from LIS.
· Software modules: Navigator and HyVolution module from Leica. Huygens Essential Deconvolution software from SVI.
· Special Features: Widefield setup with a Leica DFC365FX camera
Leica DM2500 upright microscope manual microscope
· Objectives: 2.5xAir, 10xAir, 20xAir, 40xAir, 100xOil
· Filters Cubes: for DAPI, FITC, Cy3, Cy5
· Techniques: Bright-field, dark-field, phase contrast, fluorescence
· Camera: DCF7000T Leica with LAS X software
Leica MZFLIII binocular
Continual zoom magnification (from 0.8x to 10x). Appropriate for objects of about 100 µm to a few mm. It can be used in transmission, epi-illumination and dark field mode. For the epi-illumination one can choose between two light spots or an annular light source.
Leica DMIRE2 inverted Wide-Field
· Objectives: 10xAir/0.3, 20xAir/0.7, 40x/0.80 DIC, 63xGlyc/1.3, 63xOil/1.4
· Filter Cubes: for DAPI, FITC, Cy3
JEOL JEM-1400 FLASH
The JEM-1400Flash (Jeol, Nieuwegein, Tokio) can be employed for mapping overviews as well as for detecting fine structures (of up to a 0.4 nm resolution) at high magnification. The electron source is a Lab6 crystal. The JEM-1400Flash is routinely operated at 120 KV and it is equipped with an optical microscope image linkage function. A powerful feature is the high-sensitivity Matataki Flash sCMOS camera, that allows a high frame-rate acquisition of extremely sharp images with a very low readout noise. In addition to the conventional electromagnetic image shift, the JEM-1400Flash comes with a montage system capable of utilizing stage drive for the field shift. This new system allows the simple capture of a montage panorama image over a limitless wide area at high resolution.
JEOL TEM 2100
This Transmission Electron Microscope (TEM) is dedicated to all kinds of routine inspections of thin material. The TEM is a 200 kv system with several holders for cryo observation or tomography and EDS.
JEOL 6330 Cryo Field Emission Scanning Electron Microscope (FESEM)
This JEOL FESEM can be used to make topographical images of the surface of objects, up to a resolution of about 1.5 nm.
Leica EM HPM100: High pressure freezer
Leica EM AFS: Freeze-substitution device
Leica Ultracut UC7: Cryo ultra microtome
Leica Ultracut UCT: Ultra microtome