Philips Materials Analysis


Philips Materials Analysis
m.a.verheijen@philips.com
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M.A. Verheijen
Philips Innovation Services
High Tech Campus 11
5656AE
Eindhoven
M.A. Verheijen (contact person EM); 12 EM specialists & operators,A.J.G. Mank (contact person Raman, fluorescence, AFM); 6 specialists & operators
TEM, SEM, FIB, SPM (AFM, SKPM,….), Raman, fluorescence, IR microscopy
“Nano-materialsDevices (semiconductor, polymer, LED, solar)

Reliability and failure analysis (adhesion, diffusion, shorts, local defects, ..)

Non-destructive analysis

1. Synthesis of twinning superlattices in Indium phosphide nanowires, R.E. Algra et al., Nature 456 (2008) 369-372.2. Morphology of GaP-GaAs nanowires revealed by 3D TEM tomography, M.A. Verheijen et al., Nano Lett., 7 (2007) 3051-3055

3. TEM specimen holder for simultaneous in situ heating and electrical resistance measurements””, M.A. Verheijen et al., Rev. Sci. Instrum. (2004) 75, 426

4. Confocal Raman Microscopy of Liquid-Crystal-Filled Polymer Capsules Made by Photo-Enforced Stratification,

A.J.G. Mank et al., Applied Spectroscopy, Vol. 59, Issue 8, pp. 965-975 (2005)

5. Detection of Recording Marks on Digital Versatile Discs and Blu-ray Discs using Conductive Atomic Force Microscopy,

A.J.G. Mank et al., JJAP 46 (2007) 5813

TEM, SEMs and FIBs, SPMs, Raman/IR/fluorescence microscopes
http://www.innovationservices.philips.com/service-catalog/competences/materials-analysis-lab
Multi-user, self-service facility.Stand-alone training is not offered
Courses are only supplied to long-term users
Yes