Following the succesful FRET workshop in 2011, you are welcome to join Lambert Instruments and Nikon Europe for the 2nd edition of this one-day workshop. The focus is on how to perform FRET or FLIM and how to deal with the FLIM results.

Prof. T.W.J. Gadella of the University of Amsterdam, and Dr. J. van Rheenen of the Hubrecht Institute will present their work on FRET and FLIM and are available for informal discussion during the afternoon and the evening dinner. Hands-on sessions provide an introduction into widefield FLIM and confocal FLIM. Of course there is an opportunity to measure your own samples.

Location: Nikon Europe headquarters, Amstelveen, The Netherlands

Date: February 7th 2012

More information can be found here.