Zernike Institute for Advanced Materials

Zernike Institute for Advanced Materials
B.J. Kooi
University of Groningen
Nijenborgh 4
9747 AG
B.J. Kooi,

G. Palasantzas,

G.H. ten Brink

• Scanning Electron Microscopy (SEM) including Orientation Imaging Microscopy (OIM/EBSD), Energy Dispersive X-Ray Spectrometry, In-situ mechanical testing + heating in the SEM; an ESEM is available allowing wet mode SEM(+EDX+mechanical testing) analysis;

• Transmission Electron Microscopy including Electron Diffraction, Energy Dispersive X-ray Spectrometry, Electron Energy Loss Spectroscopy, Energy-filtered imaging (GIF), In-situ heating TEM;

• Focused Ion Beam (FIB) system;

• Atomic Force Microscopy (AFM) including Magnetic force microscopy, Electric-field microscopy, Piezoresponse microscopy, Picoforce microscopy (force measurements with AFM);

• Scanning Tunneling Microscopy (STM) including UHV-Scanning Tunneling Microscopy-Nanofabrication;

• High speed CMOS camera with frame rates up to 10^5 frames/second.

Structure-property relationships, Metallurgy (all facets), Failure mode analysis (metals, semiconductor devices), Nanoparticles, Phase transformations, Precipitation, Interfaces, Thin films, Nanoscale surface roughness, Kinetic roughening/Thin film growth, Adhesion, Friction, Casimir effect, Surface forces, Micro/Nano-electromechanical systems (MEMS/NEMS), Electrical (transport) properties, Optical properties, Magnetic properties, Solar cells, Hydrogen storage, Data storage.
1. Jasper Oosthoek, Bart J. Kooi*, Jeff. Th. M. De Hosson, Rob Wolters, Dirk Gravensteijn, Karen Attenborough, Growth rate determination through automated TEM image analysis: Crystallization studies of doped SbTe phase-change thin films, Microsc. Microanal. 16, 291-299, 2010.

2. Sriram Venkatesan, Christophe Daumont, Bart J. Kooi*, Beatriz Noheda, Jeff. Th. M. De Hosson, Nanoscale Domain Evolution in Thin Films of Multiferroic TbMnO3, Phys. Rev. B 80, 214111, 2009.

3. Ramanathaswamy Pandian, Bart J. Kooi*, George Palasantzas, Jeff Th. M. De Hosson, Andrew Pauza, Nanoscale electrolytic switching in phase-change chalcogenide films, Advanced Materials 19, 4431, 2007.

4. B.J. Kooi, G. Palasantzas and J.Th.M. De Hosson, Gas phase synthesis of magnesium nanoparticles: A high resolution transamission electron microscopy study, Appl. Phys. Lett. 89, 161914 (2006).

5. L. Jankovic et al. (14 authors), Carbon Nanotubes Encapsulating Superconducting Single-Crystalline Tin Nanowires, Nano Letters 6, 1131-1135, 2006.

owner: Veeco Picoforce AFM with Nanoscope V controller, Photron FASTCAM 1024 PCI high speed camera.

direct access: JEOL2010F FEG-TEM +EDX+EELS+GIF, Philips XL30 Environmental FEG-SEM +EDX, Philips XL30 FEG-SEM +EDX+OIM, Philips XL30S (high resolution) FEG-SEM +EDX+OIM, Tescan dual beam FIB system (including FEG-SEM), Olympus VANOX-T optical microscope, µSurf Nanofocus confocal microscope.